分析手法

We provide two-dimensional nanoscale electrical properties measurement and imaging. Advanced electrical characterization technology and research into next generation semiconductor production equipment are our focus.

分析案例

Advanced analysis of devices including solar cells, CMOS sensor, logic/power devices and other third generation of semiconductor materials such as GaN & SiC are provided.

技术研发

Experts with decades of industry experience give the partners professional and Personalized solutions

委托指南

Our purpose is to provide professional and high-quality service. We look forward to serving you.

时事新闻

Cutting-edge information about detection and analysis technologies are available here

了解我们

Contact our team for business consulting and academic collaboration

Please click below for more information

Contact us !

委托流程

  • 联系我们


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     首先请联系并咨询我们

     让我们了解您的需求

 



  • 拜访与报价


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     我司销售或技术人员将拜访您，或通过线上会议进行沟通，为您提供最佳方案

     即刻向您发送报价单

 



  • 样品交接


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     需检测的样品材料可在拜访后直接面对面交接

     或进行样品寄送

 



  • 检测分析


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     我司专业的技术团队对样品进行检测分析

     预计耗时3-10个工作日（从确认收样到完成全部分析项目及提供结果）

 



  • 结果讨论


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     可提供速报对结果进行初步展示，解答您的疑问

 




  • 出具报告


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       交付正式的分析数据




Contact us !