分析手法

We provide two-dimensional nanoscale electrical properties measurement and imaging. Advanced electrical characterization technology and research into next generation semiconductor production equipment are our focus.

分析案例

Advanced analysis of devices including solar cells, CMOS sensor, logic/power devices and other third generation of semiconductor materials such as GaN & SiC are provided.

技术研发

Experts with decades of industry experience give the partners professional and Personalized solutions

委托指南

Our purpose is to provide professional and high-quality service. We look forward to serving you.

时事新闻

Cutting-edge information about detection and analysis technologies are available here

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半导体激光器(Semiconductor Laser)

垂直腔面发射激光器 (VCSEL) 的载流子分布测量


【概要】激光器通过一定的激励方式，在半导体物质的能带（导带与价带）之间，或者半导体物质的能带与杂质（受主或施主）能级之间，实现非平衡载流子的粒子数反转，当处于粒子数反转状态的大量电子与空穴复合时，便产生受激发射作用。因而针对此类器件，往往用 SMM 来评测载流子是否准确掺杂。

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